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KMID : 0357520190420050379
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Journal of Radiological Science and Technology
2019 Volume.42 No. 5 p.379 ~ p.385
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A Study on Retrospective of External Radiation Exposure Dose by Optically Stimulated Luminescence of Smart Chip Card
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Park Sang-Won
Yoo Se-Jong
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Abstract
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Radiation is used for various purposes such as cancer therapy, research of industrial and drugs. However, in case of radiation accidents such as terrorism, collapsing nuclear plant by natural disasters like Fukushima in 2011, very high radiation does expose to human and could lead to death. For this reason, many people are concerning about radiation exposures. Therefore, assessment and research of retrospective radiation dose to human by various path is an necessary task to be continuously developed. Radiation exposure for workers in radiation fields can be generally measured using a personal exposure dosimeter such as TLD, OSLD. However, general people can’t be measured radiation doses when they are exposed to radiation. And even if radiation fields workers, when they do not in possession personal dosimeter, they also can’t be measured exposure dose immediately. In this study, we conduct retrospective research on reconstruction of dose after exposure by using smart chip card of personal items through Optically Stimulated Luminescence (OSL). The OSL signal of smart chip card shows linear response from 0.06 Gy to 15 Gy and results of fading rate 45 %, 48% for 24 and 48 hours due to the natural emission of radiation in sample, respectively. The minimum detectable limit (MDD) was 0.38 mGy. This values are expected to use as correction values for reconstruction of exposure dose.
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KEYWORD
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Smart Chip Card, Radiation Dose, Dosimeter, Optically Stimulated Luminescence, Dose Reconstruction
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